AVS 62nd International Symposium & Exhibition
    Exhibitor Technology Spotlight Tuesday Sessions
       Session EW-TuL

Paper EW-TuL6
AFM of Thin Films for Nanomechanical, Nanoelectrical, and Electromechanical Characterization

Tuesday, October 20, 2015, 2:00 pm, Room Hall 1

Session: Exhibitor Technology Spotlight Session
Presenter: Amir Moshar, Asylum Research, an Oxford Instruments Company
Authors: A. Moshar, Asylum Research, an Oxford Instruments Company
A. Labuda, Asylum Research, an Oxford Instruments Company
Correspondent: Click to Email
AFMs now offer characterization beyond just thickness, grain and domain sizes of thin films and coatings. Instrumentation advances enable hassle-free environmental experiments for studying solvent and thermal effects. Nanoelectrical, nanomechanical and electromechanical modes allow quantitative measurements of functional properties. AFMs are also faster, easier-to-use, and allow users a wider variety of such techniques enabling more meaningful, correlative results. In this presentation, Asylum Research will discuss the latest advances in AFM instrumentation, scan modes, and give real-world examples of research being done on the Cypher™ and MFP-3D™ AFMs. We’ll also introduce the science behind making quantitative measurements of electromechanical response with interferometric AFM.