AVS 62nd International Symposium & Exhibition
    Exhibitor Technology Spotlight Tuesday Sessions
       Session EW-TuL

Paper EW-TuL4
Latest Developments in XPS and Related Methods from Kratos Analytical

Tuesday, October 20, 2015, 1:20 pm, Room Hall 1

Session: Exhibitor Technology Spotlight Session
Presenter: Chris Blomfield, Kratos Analytical Limited, UK
Authors: C.J. Blomfield, Kratos Analytical Limited, UK
J.D.P. Counsell, Kratos Analytical Limited, UK
S.J. Coultas, Kratos Analytical Limited, UK
S.C. Page, Kratos Analytical Limited, UK
C. Moffitt, Kratos Analytical Limited
Correspondent: Click to Email
The Axis Supra is the latest generation of XPS instrument from Kratos Analytical. In addition to offering enhanced energy resolution and sensitivity for XPS, it has a 15µm small area spectroscopy and 1µm imaging capability. The instrument is designed to offer a high level of flexibility and can be fitted with a range of complimentary surface analysis techniques such as UPS, ISS, AES, along with an additional surface science station and a range of sample treatment capabilities. In addition to offering benchmark level performance, the instrument and ESCApe data system combine to offer a high throughput platform optimised for the multiuser environment of today’s surface analysis laboratory. Samples may pre-aligned and analyses predefined so that, when combined with the automated sample transfer capability, high levels of throughput can be achieved with unattended operation. Applications of high resolution imaging, multispectral imaging, gas cluster ion source and GCIS-UPS studies will be presented on a range of new materials to underline the leading capabilities of the Axis Supra.