| AVS 62nd International Symposium & Exhibition | |
| Applied Surface Science | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AS-MoM1 Quantitative XPS of Core-Shell Nanoparticles Cedric Powell, National Institute of Standards and Technology (NIST), M. Chudzicki, W.S.M. Werner, W. Smekal, Technical University of Vienna, Austria |
| 8:40am | AS-MoM2 The Satellites of the 2p Core Level of Transition-Metals Alberto Herrera-Gomez, CINVESTAV-Queretaro, Mexico |
| 9:00am | AS-MoM3 Quantitative Analysis of Advanced Commercial Glasses for Display Technologies Cody Cushman, Brigham Young University, N.J. Smith, Corning, T. Grehl, P. Bruener, ION-TOF GmbH, Germany, M.R. Linford, Brigham Young University |
| 9:20am | AS-MoM4 New Horizons in Practical Applications of Sputter Depth Profiling W.F. Stickle, C.N. Young, M.D. Johnson, HP, A.A. Ellsworth, Amy Walker, University of Texas at Dallas |
| 9:40am | AS-MoM5 Invited Paper ASSD 30th Anniversary Lecture: Sensitivity Factors in XPS: Where Do They Come From and How Accurate Are They? John Grant, University of Dayton |
| 10:40am | AS-MoM8 Ar+ and Cluster Ion Depth Profiling for Quantitative XPS Inorganic Thin Film Analysis Jennifer Mann, J.F. Moulder, S.R. Bryan, J.S. Hammond, Physical Electronics |
| 11:00am | AS-MoM9 Preservation of Chemical States in Mixed Material Surfaces when Profiling with Noble Gas Clusters Christopher Deeks, J.P.W. Treacy, P. Mack, T.S. Nunney, Thermo Fisher Scientific, UK |
| 11:20am | AS-MoM10 Invited Paper Photoemission from Complex Material Systems: Obtaining Quantitative Information Robert Opila, J. Church, University of Delaware |