| AVS 62nd International Symposium & Exhibition | |
| Applied Surface Science | Monday Sessions |
| Session AS-MoM |
| Session: | Quantitative Surface Analysis: Obtaining Quantitative Information in the Face of Material Complexity and Morphology Influences |
| Presenter: | Robert Opila, University of Delaware |
| Authors: | R.L. Opila, University of Delaware J. Church, University of Delaware |
| Correspondent: | Click to Email |
Photoemission is still a rapidly developing technique for surface analysis of complex systems using advancing physical and software technologies. In this talk we will consider two applications of electron spectroscopy taking advantage of hardware and software innovations.
Recently, the adaptation of XPS studies to synchrotron beamlines has produced a new technique – Variable Kinetic Energy XPS (VKE-XPS). VKE-XPS collects XPS data at multiple photon energies, and by doing so, also varies the likelihood of detection of electrons from buried layers. Compositional depth information can be extracted from VKE-XPS data sets by statistically sifting through the data using likelihood calculations assigned to each randomly generated depth profile. We have deployed a new algorithm, Bayes-Sim, which applies a Bayesian statistical approach to establish the framework for a belief system for each compositional simulation. Optimization of the search is carried out using a simulated annealing schedule, which assists in avoiding only locally optimized configurations. The Bayes-Sim algorithm has been encapsulated in a distributable, open-source graphical user interface J-FAB. These improvements were used to study high dielectric materials
Some of the most advanced chemical analytical techniques have been applied to study the degradation of paint pigments from artists in the post-impressionist era (late to early 20th century). The capability to investigate chemical speciation and elemental mapping in micro-samples is enabled only by the spatial resolution and high brilliance of synchrotron techniques like XANES and SR-FTIR. Fairly sophisticated data analyses for synchrotron beam lines have been encapsulated in easy to use software packages thereby complimenting the burgeoning field of art in science with the tools needed to tackle complex problems. In this work degradation of paintings by Munch and Matisse will be discussed.