| AVS 60th International Symposium and Exhibition | |
| Scanning Probe Microscopy Focus Topic | Friday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | SP+AS+EM+GR+MI+NS+SS-FrM1 STM Mapping of Thermoelectric Power on Graphene across Defects and Boundaries J. Park, Oak Ridge National Laboratory, G. He, R.M. Feenstra, Carnegie Mellon University, A.P. Li, Oak Ridge National Laboratory |
| 8:40am | SP+AS+EM+GR+MI+NS+SS-FrM2 New Milestones in Scanning Probe Microscopy: Graphene on Rh(111) Studied by DFT, STM and NC-AFM A. Thissen, SPECS Surface Nano Analysis GmbH, Germany |
| 9:00am | SP+AS+EM+GR+MI+NS+SS-FrM3 Invited Paper Electric Field Tuning of 2-dimensional Electrons in Graphene and Topological Insulators J.A. Stroscio, J. Ha, National Institute of Standards and Technology |
| 9:40am | SP+AS+EM+GR+MI+NS+SS-FrM5 Invited Paper SPM: Manipulating Spin to Operating Molecular Nanomachines S.-W. Hla, Argonne National Laboratory |
| 10:20am | SP+AS+EM+GR+MI+NS+SS-FrM7 New Experiments and Applications Made Possible by a Low Temperature 4-Tip STM with UHV-SEM Navigation A. Bettac, B. Guenther, J. Chrost, J. Hilton, J. Koeble, A. Feltz, Omicron NanoScience, Germany |
| 10:40am | SP+AS+EM+GR+MI+NS+SS-FrM8 Electrical Characterization of GaAs Nanowires with a 4-tip STM B. Voigtlaender, S. Korte, V. Cherepanov, Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, Germany, M. Steidl, W. Zhao, P. Kleinschmidt, T. Hannappel, TU Ilmenau, Germany, W. Prost, University of Duisburg-Essen, Germany |
| 11:00am | SP+AS+EM+GR+MI+NS+SS-FrM9 Atomic and Electronic Structure of an Alloyed Topological Insulator Bi1.5Sb0.5Te1.7Se1.3 W. Ko, I. Jeon, H.W. Kim, H. Kwon, Samsung Advanced Institute of Technology, Republic of Korea, S.-J. Kahng, Korea University, Republic of Korea, J. Park, J.S. Kim, Pohang University of Science and Technology, Republic of Korea, S.W. Hwang, H. Suh, Samsung Advanced Institute of Technology, Republic of Korea |
| 11:20am | SP+AS+EM+GR+MI+NS+SS-FrM10 Schottky Barrier Height Measurements of Cu/Si(001), Ag/Si(001), and Au/Si(001) Interfaces Utilizing Ballistic Electron Emission Microscopy and Ballistic Hole Emission Microscopy R. Balsano, V.P. LaBella, College of Nanoscale Science and Engineering |
| 11:40am | SP+AS+EM+GR+MI+NS+SS-FrM11 A STM Study of a Self Assembled Cu-Si Nanoisland on Si(110) P.K. Ng, University of Illinois at Chicago, B. Fisher, N.P. Guisinger, Argonne National Laboratory, C.M. Lilley, University of Illinois at Chicago |