| AVS 60th International Symposium and Exhibition | |
| Helium Ion Microscopy Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | HI-ThA1 Invited Paper Imaging of Biological Cells and Carbon Nanomembranes with Helium Ion Microscopy A. Beyer, Bielefeld University, Germany |
| 2:40pm | HI-ThA3 Invited Paper Patterning of Sub-10 nm Optical Apertures on Single Crystal Metallic Films with the Helium Ion Microscope D. Pickard, Unaffiliated, H.F. Hao, V. Viswanathan, National University of Singapore, M. Bosman, IMRE , A*STAR, J. Dorfmüller, H. Giessen, University of Stuttgart, Germany, A.S. Yusuf, Z.K. Ai, Y. Wang, M. Mahmoudi, National University of Singapore |
| 3:40pm | HI-ThA6 Characterization of 2D Materials by using Scanning Helium Ion Microscopy H.X. Guo, J.H. Gao, D. Fujita, National Institute for Materials Science, Japan |
| 4:00pm | HI-ThA7 Helium Ion Microscopy of CVD-grown Films: Transition Metals and Catalytically Active Transition Metal Oxides H. Vieker, A. Beyer, Z.-Y. Tian, P. Mountapmbeme Kouotou, A. El Kasmi, K. Kohse-Höinghaus, A. Gölzhäuser, Bielefeld University, Germany |
| 4:20pm | HI-ThA8 Helium Ion Microscopy of Blood Clot Microstructure S.A. Boden, University of Southampton, UK, G. Mills, P.A. Evans, Morriston Hospital, UK, M. Bagnall, H.N. Rutt, University of Southampton, UK |
| 4:40pm | HI-ThA9 Formation of “Ridge” like Structures for Possible Suppression of Secondary Electron Emission on Cu and Al Surfaces V. Shutthanandan, S. Manamdhar, M.I. Nandasiri, A. Devaraj, D.E. Perea, S.A. Thevuthasan, D.M. Asner, Pacific Northwest National Laboratory, D. Rubin, W.H. Hartung, Y. Li, Cornell University |
| 5:20pm | HI-ThA11 Towards SIMS on the Helium Ion Microscope: Detection Limits and Experimental Results on the ORION T. Wirtz, D. Dowsett, Centre de Recherche Public – Gabriel Lippmann, Luxembourg, S. Sijbrandij, J.A. Notte, Carl Zeiss Microscopy |
| 5:40pm | HI-ThA12 Blunt Tungsten Tip Cleaning with Nitrogen Gas Reaction in Ultra-high Vacuum I.-Y. Park, B. Cho, C. Han, J. Kim, S.J. Ahn, KRISS, Republic of Korea |