| AVS 60th International Symposium and Exhibition | |
| Applied Surface Science | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | AS-MoA1 Invited Paper Status and Prospects for ICP Focused Ion Beams N. Smith, P. Tesch, N. Martin, Oregon Physics LLC, R. Boswell, Oregon Physics LLC and Australian National University |
| 2:40pm | AS-MoA3 Detection of Small Molecules on Intact Biofilms using Femtosecond Laser Desorption Postionization Mass Spectrometry Y. Cui, C. Bhardwaj, S. Milasinovic, R. Gordon, L. Hanley, University of Illinois at Chicago |
| 3:00pm | AS-MoA4 TOF-MEIS Analysis of Nanostructured Materials K. Jung, DGIST, Republic of Korea, W. Min, KMAC, Republic of Korea, H. Yu, KRISS, Republic of Korea, K. Yu, KMAC, Republic of Korea, M. Sirtica, P.L. Grande, UFRGS, Brazil, D. Moon, DGIST, Republic of Korea |
| 3:40pm | AS-MoA6 Effect of Ion Bombardment of Novel Electronic Materials J.D.P. Counsell, S.J. Coultas, C.J. Blomfield, S.J. Hutton, A.J. Roberts, Kratos Analytical Limited, UK |
| 4:00pm | AS-MoA7 Invited Paper Adventures in Mass Spectrometry Imaging - From Pictures to Words I.S. Gilmore, National Physical Laboratory, UK |
| 4:40pm | AS-MoA9 Argon Gas Cluster Ion Beam (GCIB) Sputter Yields: Measurements for 22 Biological and Organic Electronic Materials, Metals and Oxides P. Cumpson, J. Portoles, A. Barlow, N. Sano, Newcastle University, UK |
| 5:00pm | AS-MoA10 Mass Imaging of Biological Samples with Focused Massive Ar Cluster Ion Beams J. Matsuo, QSEC, Kyoto University, CREST, Japan, S. Nakagawa, Kyoto University, CREST, Japan, M. Fujii, QSEC, Kyoto University, CREST, Japan, T. Aoki, T. Seki, Kyoto University, CREST, Japan |
| 5:20pm | AS-MoA11 Dissociation of Argon Cluster Ions by Impact on Metal Surfaces K. Mochiji, N. Inui, K. Moritani, University of Hyogo, Japan |