| AVS 60th International Symposium and Exhibition | |
| Thin Film | Wednesday Sessions |
| Session TF+AS+BI+EM+SE+SS-WeA |
| Session: | Applications of Self-Assembled Monolayers and Nano-Structured Assemblies |
| Presenter: | P. Cyganik, Jagiellonian University, Poland |
| Authors: | J.W. Ossowski, Jagiellonian University, Poland J. Rysz, Jagiellonian University, Poland D. Maciazek, Jagiellonian University, Poland M. Krawiec, Maria Curie-Sklodowska University, Poland Z. Postawa, Jagiellonian University, Poland A. Terfort, Goethe University, Germany P. Cyganik, Jagiellonian University, Poland |
| Correspondent: | Click to Email |
Self-Assembled Monolayers (SAMs) play nowadays a key role in many aspects of nanotechnology ranging from pattering and molecular electronics up to biocompatible materials. One of the key requirements for successful use of SAMs in all of these applications is a control of their stability at the molecule-substrate interface. Analysis of this interface is however extremely difficult for technologically relevant, and therefore, more complicated SAMs. In this presentation we report extensive static secondary ion mass spectrometry (SIMS) studies on series of thiols and selenols on Au(111) substrates where structure and stability of molecule-substrate interface were systematically modified.1 Correlating SIMS data with our previous microscopic2,3, spectroscopic4 and neutral mass spectrometry studies5,6 we show that, SIMS can be successfully applied to monitor fine changes in the molecule-substrate interface stability of these model SAMs. To reveal the possible mechanism of ion-induced desorption sensitivity to the SAM-substrate interface energetics we discuss also results of our molecular-dynamic (MD) simulations of the desorption process for this system with starting structure calculated by DFT calculations.1 Our data show that a new approach for probing the stability of molecule-substrate interface in SAMs can be proposed by using such relatively popular and fast technique as SIMS, which can be applied for virtually all complicated and technologically relevant SAMs.
References
(1) J. Ossowski, P. J. Rysz, D. Maciazek, M. Krawiec, Z. Postawa, A. Terfort and P. Cyganik submitted.
(2) P. Cyganik, K. Szelagowska-Kunstman, et al. J. Phys. Chem. C2008, 112, 15466.
(3) M. Dendzik, A. Terfort, P. Cyganik J. Phys. Chem. C2012, 116, 19535.
(4) K. Szelagowska-Kunstman, P. Cyganik, et al. Phys. Chem. Chem. Phys.2010, 12, 4400.
(5) S. Wyczawska, P. Cyganik, A. Terfort, P. Lievens, ChemPhysChem(Communication)2011, 12, 2554.
(6) F. Vervaecke, S. Wyczawska, P. Cyganik, et al. ChemPhysChem(Communication)2011, 12, 140.