| AVS 59th Annual International Symposium and Exhibition | |
| Exhibitor Technology Spotlight | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 12:20pm | EW-TuL2 Complementary Nature of XPS and Raman Techniques R. Kershner, T. Nunney, Thermo Fisher Scientific |
| 12:40pm | EW-TuL3 Multi-Dimensional XPS Profiling from Thermo Fisher Scientific A. Bushell, R.G. White, T.S. Nunney, P. Mack, A.E. Wright, Thermo Fisher Scientific, UK |
| 1:00pm | EW-TuL4 Organic Depth Profiling using XPS – Pro’s and Con’s of Different Polyatomic Species C. Blomfield, S. Hutton, Kratos Analytical Ltd, UK, D. Surman, Kratos Analytical Inc. |
| 1:20pm | EW-TuL5 What's New from Physical Electronics J.F. Moulder, Physical Electronics |
| 1:40pm | EW-TuL6 KolibriSensor and Tyto: New Milestones in Scanning Probe Microscopy T. Hänke, Y. Dedkov, A. Pioda, T. Kampen, A. Thissen, SPECS Surface Nano Analysis GmbH, Germany |