| AVS 59th Annual International Symposium and Exhibition | |
| Applied Surface Science | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AS-MoM1 Invited Paper 2012 AVS Albert Nerken Award Lecture: Characterization of Thin-Film Nano-Structures by XPS S. Tougaard, University of Southern Denmark |
| 9:00am | AS-MoM3 Simulation of Electron Spectra for Surface Analysis (SESSA): (Hard) X-ray Photoelectron Spectra of Nanostructured Surfaces W.S.M. Werner, W. Smekal, Vienna University of Technology, Austria, C.J. Powell, National Institute of Standards and Technology |
| 9:20am | AS-MoM4 XPS Characterisation of InP Features Etched in Cl2-Ar and Cl2-H2 Inductively Coupled Plasmas C. Cardinaud, CNRS, France, R. Chanson, CNRS-IMN, France, S. Bouchoule, CNRS-LPN, France, A. Rhallabi, M.-C. Fernandez, Université de Nantes, France |
| 9:40am | AS-MoM5 Simplified Extrinsic Background for XPS Data Fitting A. Herrera-Gomez, UAM-Azcapotzalco and CINVESTAV-Queretaro, Mexico |
| 10:00am | AS-MoM6 Effective Attenuation Lengths for Photoelectrons in Thin Films of Silicon Oxynitride and Hafnium Oxynitride on Silicon C.J. Powell, National Institute of Standards and Technology, W.S.M. Werner, W. Smekal, G. Tasneem, Vienna University of Technology, Austria |
| 10:40am | AS-MoM8 Invited Paper Valence Band XPS: A Valuable, but Underexploited, Tool for the Identification of Subtle Differences in Surface Chemistry P.M.A. Sherwood, Oklahoma State University |
| 11:20am | AS-MoM10 Multitechnique Electron Spectroscopic Characterisation of Optoelectronic Devices A.E. Wright, P. Mack, R.G. White, A. Bushell, Thermo Fisher Scientific, UK |
| 11:40am | AS-MoM11 Chemically Resolved Electrical Characterisation of Working Devices by XPS S. Suzer, Bilkent University, Turkey |