AVS 59th Annual International Symposium and Exhibition
    Plasma Science and Technology Tuesday Sessions
       Session PS1-TuM

Paper PS1-TuM12
Characterizing Electron Beam Generated Plasmas for Plasma Processing Applications

Tuesday, October 30, 2012, 11:40 am, Room 24

Session: Plasma Diagnostics, Sensors and Control 1
Presenter: D.R. Boris, Naval Research Laboratory
Authors: D.R. Boris, Naval Research Laboratory
R. Fernsler, Naval Research Laboratory
S.G. Walton, Naval Research Laboratory
Correspondent: Click to Email

Electron beam generated plasmas have a variety of unique features that make them distinctive plasma sources for materials processing. They are characterized by high plasma density, very low electron temperature, and unique gas phase chemistries that distinguish them discharge based plasmas. This work presents frequency probe and Langmuir probe measurements (where applicable) of plasma density over a range of 109 to 1012 cm-3 in a variety of processing plasma chemistries. This work also features the effect of varying gas chemistry on energy distribution function measurements as well as OES (optical emission spectroscopy) and mass spectrometry measurements.