| AVS 59th Annual International Symposium and Exhibition | |
| Applied Surface Science | Friday Sessions |
| Session AS+TF+VT-FrM |
| Session: | Surface Analysis using Synchrotron Techniques |
| Presenter: | H.J. Bergersen, VG Scienta, Sweden |
| Authors: | H.J. Bergersen, VG Scienta, Sweden J. Åhlund, VG Scienta, Sweden R. Moberg, VG Scienta, Sweden |
| Correspondent: | Click to Email |
The fields of Hard X-ray Photoelectron Spectroscopy (HAXPES) and High Pressure Photoemission (HiPP) are growing fast. In this contribution we present instrument development and results within HAXPES and HiPP as well as the merged field of HiPP-HAXPES.
Photoelectron spectroscopy (PES) is an excellent tool in surface science due to the possibility to probe electronic and geometric structure. During the past decade Angle Resolved Photoelectron Spectroscopy (ARPES) has had a remarkable upswing, due to the development of parallel angular detector analyzers, and is today used routinely for band mapping, depth profiling and X-ray diffraction (XPD) in the Ultra Violet (UV) and soft X-ray regime. With higher energies (hard X-rays), in combination with improvements in PES detection techniques, this tool can be extended to the HAXPES regime, enabling studies of bulk materials. Here we demonstrate new development of analysers capable of measuring angular resolved spectra in the High Energy regime as well as results obtained using such analyzers.
Experiments done under normal surface science conditions (Ultra High Vacuum) are of limited use in some applications, e.g catalysis, due to the pressure gap problem. This motivates the study of systems at ambient pressures. Here we present a HiPP instrument developed in collaboration with Advanced Light Source (ALS). This instrument allows standard PES measurements as well as spatial and angle resolved spectra at HiPP conditions. Some recent results include spatially resolved investigations of solid oxide electrochemical cells (SOC:s) and electrochemical properties of junctions.
Finally, we report on recent advances in constructing a new generation of instrumentation combining HiPP and HAXPES. A novel electron analyser, designed for optimal transmission in combination with very efficient differential pumping, will be presented together with preliminary results.