AVS 59th Annual International Symposium and Exhibition
    Applied Surface Science Friday Sessions
       Session AS+TF+VT-FrM

Paper AS+TF+VT-FrM6
Spectroscopic Imaging using Vector Potential Photoelectron Microscopy

Friday, November 2, 2012, 10:00 am, Room 20

Session: Surface Analysis using Synchrotron Techniques
Presenter: R. Browning, R. Browning Consultants
Correspondent: Click to Email

A new class of electron microscope, vector potential photoelectron microscopy (VPPEM) has been developed. This microscope will enable the chemical microanalysis of a wide range of samples using photoelectron spectroscopy (PES). The microscope is a full field spectroscopic imaging technique with a very large equivalent depth of focus. The unique imaging properties of this method opens up many experimental opportunities incuding the chemical microanalysis of a wide range of real world samples. Highly structured, three dimensional samples, such as fiber mats and fracture surfaces can be imaged, as well as insulators, and magnetic materials. The new microscope uses the vector potential field from a solenoid magnet as a spatial reference for imaging. A prototype instrument has demonstrated imaging of Au grids, uncoated silk, magnetic steel wool, and micron sized single strand tungsten wires.