| AVS 57th International Symposium & Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| EL+AS+EM+MS+TF-ThP1 Temperature Dependence of the Dielectric Function of AlSb Measured by Spectroscopic Ellipsometry J.J. Yoon, Y.W. Jung, J.S. Byun, S.Y. Hwang, Y.D. Kim, Kyung Hee University, Republic of Korea, S.H. Shin, S.Y. Kim, J.D. Song, Korea Institute of Science and Technology, Republic of Korea |
| EL+AS+EM+MS+TF-ThP2 Optical Properties and Humidity Effects on Thin Films of Micro Fibrillated Cellulose Studied by Spectroscopic Ellipsometry H. Arwin, E. Antunez de Mayolo, Linköping University, Sweden, M. Eita, Royal Institute of Technology (KTH), Sweden, H. Granberg, Innventia Ab, Sweden, L. Wågberg, Royal Institute of Technology (KTH), Sweden |
| EL+AS+EM+MS+TF-ThP3 Spectroscopic Ellipsometry and X-ray Photoelectron Spectroscopy of La2O3 Thin Films Deposited by Reactive Magnetron Sputtering V. Atuchin, Institute of Semiconductor Physics, Russia, A.V. Kalinkin, Boreskov Institute of Catalysis, Russia, V.A. Kochubey, V.N. Kruchinin, Institute of Semiconductor Physics, Russia, R.S. Vemuri, C.V. Ramana, University of Texas at El Paso |
| EL+AS+EM+MS+TF-ThP4 Analysis of Anomalous Film Growth when Yttrium Oxide Thin Films are Exposed to 7.2eV Light D. Mortensen, D.D. Allred, Brigham Young University |
| EL+AS+EM+MS+TF-ThP5 In-Situ Spectroscopic Ellipsometry of Lithium Ion Intercalation in GLAD Three-Dimensional Nanostructured Thin Films E. Montgomery, M. Schubert, E.B. Schubert, T. Hofmann, D. Schmidt, University of Nebraska - Lincoln, R.A. May, University of Texas at Austin |
| EL+AS+EM+MS+TF-ThP6 Multi Phase Model Generation of Reflection Anisotropy Spectra of Copper Phthalocyanine Films on Vicinal Silicon Substrates F. Seidel, L. Ding, O.D. Gordan, D.R.T. Zahn, Chemnitz University of Technology, Germany |