AVS 53rd International Symposium | |
Nanometer-scale Science and Technology | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
8:00am | NS-MoM1 A Novel Scanning Probe Microscope with MOS Transistor and Nano Tip S.H. Lee, G. Lim, W. Moon, Pohang University of Science and Technology, Republic of Korea |
8:20am | NS-MoM2 Simulation of Electrostatic Force Microscopy Imaging Modes D.F. Ogletree, Lawrence Berkeley National Laboratory |
8:40am | NS-MoM3 Chemical Specificity and Defect Characterization on MgO(001) O.H. Pakarinen, Helsinki University of Technology, Finland, A. Ishiyama, Osaka University, Japan, A.S. Foster, Helsinki University of Technology, Finland, N. Oyabu, M. Abe, O. Custance, Osaka University, Japan, R.M. Nieminen, Helsinki University of Technology, Finland, S. Morita, Osaka University, Japan |
9:00am | NS-MoM4 QPlus Sensor AFM at Low Temperatures with Atomic Resolution on NaCl A. Bettac, M. Maier, M. Wittmann, A. Feltz, T. Berghaus, Omicron NanoTechnology GmbH, Germany |
9:20am | NS-MoM5 Invited Paper Nanoscale Spectroscopy with Optical Antennas L. Novotny, N. Anderson, P. Bharadwaj, University of Rochester |
10:20am | NS-MoM8 Ultra High-Stability SPM to Study Molecules at Variable Temperature A.V. Belyayev, S.A. Saunin, NTMDT, Russia, Y.A. Bobrov, Nanotechnologies America, Inc. |
10:40am | NS-MoM9 Mapping Atomic-Scale Interaction Potentials A. Schirmeisen, D. Weiner, H. Fuchs, University of Muenster, Germany |
11:00am | NS-MoM10 Electromechanical Imaging of Ferroelectric Materials in a Liquid Environment: Ultrahigh Resolution and Novel Physics B.J. Rodriguez, S. Jesse, A.P. Baddorf, S.V. Kalinin, Oak Ridge National Laboratory, B. Mirman, Suffolk University, E.A. Eliseev, A.N. Morozovska, National Academy of Science of Ukraine |
11:20am | NS-MoM11 Spatial Resolution, Information Limit, and Contrast Transfer in Scanning Probe Microscopy S.V. Kalinin, A.Y. Borisevich, V. Meunier, S. Dag, S. Jesse, B.J. Rodriguez, S.J. Pennycook, Oak Ridge National Laboratory |
11:40am | NS-MoM12 Raman Spectroscopy of Strained Silicon Structures for CMOS Technology M. Hecker, C. Georgi, A. Mai, L. Zhu, E. Zschech, AMD Saxony LLC & Co. KG Dresden, Germany |