AVS 53rd International Symposium
    Nanometer-scale Science and Technology Monday Sessions

Session NS-MoM
Nanoscale Imaging Techniques

Monday, November 13, 2006, 8:00 am, Room 2016
Moderator: M.C. Hersam, Northwestern University


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:00am NS-MoM1
A Novel Scanning Probe Microscope with MOS Transistor and Nano Tip
S.H. Lee, G. Lim, W. Moon, Pohang University of Science and Technology, Republic of Korea
8:20am NS-MoM2
Simulation of Electrostatic Force Microscopy Imaging Modes
D.F. Ogletree, Lawrence Berkeley National Laboratory
8:40am NS-MoM3
Chemical Specificity and Defect Characterization on MgO(001)
O.H. Pakarinen, Helsinki University of Technology, Finland, A. Ishiyama, Osaka University, Japan, A.S. Foster, Helsinki University of Technology, Finland, N. Oyabu, M. Abe, O. Custance, Osaka University, Japan, R.M. Nieminen, Helsinki University of Technology, Finland, S. Morita, Osaka University, Japan
9:00am NS-MoM4
QPlus Sensor AFM at Low Temperatures with Atomic Resolution on NaCl
A. Bettac, M. Maier, M. Wittmann, A. Feltz, T. Berghaus, Omicron NanoTechnology GmbH, Germany
9:20am NS-MoM5 Invited Paper
Nanoscale Spectroscopy with Optical Antennas
L. Novotny, N. Anderson, P. Bharadwaj, University of Rochester
10:20am NS-MoM8
Ultra High-Stability SPM to Study Molecules at Variable Temperature
A.V. Belyayev, S.A. Saunin, NTMDT, Russia, Y.A. Bobrov, Nanotechnologies America, Inc.
10:40am NS-MoM9
Mapping Atomic-Scale Interaction Potentials
A. Schirmeisen, D. Weiner, H. Fuchs, University of Muenster, Germany
11:00am NS-MoM10
Electromechanical Imaging of Ferroelectric Materials in a Liquid Environment: Ultrahigh Resolution and Novel Physics
B.J. Rodriguez, S. Jesse, A.P. Baddorf, S.V. Kalinin, Oak Ridge National Laboratory, B. Mirman, Suffolk University, E.A. Eliseev, A.N. Morozovska, National Academy of Science of Ukraine
11:20am NS-MoM11
Spatial Resolution, Information Limit, and Contrast Transfer in Scanning Probe Microscopy
S.V. Kalinin, A.Y. Borisevich, V. Meunier, S. Dag, S. Jesse, B.J. Rodriguez, S.J. Pennycook, Oak Ridge National Laboratory
11:40am NS-MoM12
Raman Spectroscopy of Strained Silicon Structures for CMOS Technology
M. Hecker, C. Georgi, A. Mai, L. Zhu, E. Zschech, AMD Saxony LLC & Co. KG Dresden, Germany