| AVS 52nd International Symposium | |
| Vacuum Technology | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | VT-TuA1 A New Determination of the Volume Ratio of the NPLI Static Expansion System P. Mohan, National Physical Laboratory, India |
| 2:20pm | VT-TuA2 Precise Volume Measurement of Bellows with its Length for a Constant Pressure Flowmeter K. Arai, H. Akimichi, M. Hirata, AIST, Japan |
| 2:40pm | VT-TuA3 High-accuracy Vacuum Calibration System S. Tison, S. Lu, S. Sukumaran, Mykrolis Corporation |
| 3:00pm | VT-TuA4 Development of a New High-Stability Transfer Standard Based on Resonant Silicon Gauges for the Range 0.1 kPa - 130 kPa J.H. Hendricks, A.P. Miiller, NIST |
| 3:20pm | VT-TuA5 New Calibration Apparatus for 1, 10, 100 Torr Capacitance Diaphragm Gauges S.Y. Woo, I.M. Choi, Korea Research Institute of Standards and Science |
| 3:40pm | VT-TuA6 Real Time Calibration of Leak Detection Sensitivity X. Chen, T.B. Huang, L.B. Xiao, L.Z. Cha, Tsinghua University, China |