| AVS 52nd International Symposium | |
| Nanometer-Scale Science and Technology | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | NS-WeM1 Invited Paper Atomic Scale Analysis of Dielectric Surfaces and Nanostructures M. Reichling, Universitaet Osnabrueck, Germany |
| 9:00am | NS-WeM3 Bioelectromechanical Imaging by Scanning Probe Microscopy: Galvani's Experiment on the Nanoscale S.V. Kalinin, Oak Ridge National Laboratory, B.J. Rodriguez, North Carolina State University, S. Jesse, A.P. Baddorf, Oak Ridge National Laboratory, A. Gruverman, North Carolina State University |
| 9:20am | NS-WeM4 Bridge Enhanced Nanoscale Impedance Microscopy L.S.C. Pingree, M.C. Hersam, Northwestern University |
| 9:40am | NS-WeM5 Development of a Tunable Microwave Frequency Alternating Current Scanning Tunneling Microscope to Profile Dopant Density in Semiconductors A.M. Moore, The Pennsylvania State University, B.A. Mantooth, GeoCenters, P.S. Weiss, The Pennsylvania State University |
| 10:20am | NS-WeM7 Invited Paper Single-Electron Charging in InAs Quantum Dot Observed by NC-AFM P. Grutter, McGill University, Canada |
| 11:00am | NS-WeM9 Development and Characterisation of Reference Materials for Nanotechnology: High Lateral Resolution Auger Electron Spectroscopy on Semiconductor Heterostructures J. Westermann, U. Roll, Omicron NanoTechnology GmbH, Germany, M. Senoner, W. Unger, Federal Institute for Materials Research and Testing, BAM, Germany |
| 11:20am | NS-WeM10 STM and AFM Imaging with In-Situ Tip-Characterization C.J. Chen, O. Pietzsch, D. Haude, R. Wiesendanger, Hamburg University, Germany |
| 11:40am | NS-WeM11 Towards the Fabrication of Ultra High Throughput Optical Fiber Probes B.C. Gibson, S.T. Huntington, University of Melbourne, Australia, J. Canning, K. Lyytikainen, University of Sydney, Australia, J.D. Love, Australian National University, Australia |