AVS 52nd International Symposium
    Applied Surface Science Thursday Sessions

Session AS+TF-ThA
Thin Film Characterization II

Thursday, November 3, 2005, 2:00 pm, Room 206
Moderator: K. Lloyd, Dupont


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Click a paper to see the details. Presenters are shown in bold type.

2:00pm AS+TF-ThA1
C@sub n@ (50@<=@n<60) Films on HOPG
A. Böttcher, P. Weis, S.-S. Jester, D. Löffler, M.M. Kappes, Universität Karlsruhe, Germany
2:20pm AS+TF-ThA2
An in situ Study on Amorphous Carbon Films and the Vapor Phase Lubrication in Magnetic Data Storage Media
Y. Yun, A.J. Gellman, Carnegie Mellon University
2:40pm AS+TF-ThA3
Laser Processing of Polymer Nanocomposite Thin Films
A.T. Sellinger, E.M. Leveugle, G. Peman, L.V. Zhigilei, J.M. Fitz-Gerald, University of Virginia
3:00pm AS+TF-ThA4
Thin Films of Fe on Pt(111) : Alloy Formation
M. Yoshimura, S. Komaru, K. Ueda, Toyota Technological Institute, Japan
3:40pm AS+TF-ThA6
Scanning Auger Microscopy of Alkylated Crystalline Silicon(111) Surfaces
H.M. Meyer III, Oak Ridge National Laboratory, L.J. Webb, California Institute of Technology, D.F. Paul, Physical Electronics, N.S. Lewis, California Institute of Technology
4:00pm AS+TF-ThA7
Electron Beam Induced Processes for Repairing Defects on Quartz Masks
M. Fischer, J. Gottsbachner, S. Mueller, E. Bertagnolli, H.D. Wanzenboeck, Vienna University of Technology, Austria
4:20pm AS+TF-ThA8
Extending Defect Root-Cause Analysis to sub-100nm in-film Particle Contamination
C. Lazik, Y. Uritsky, Applied Materials, Inc.