| AVS 52nd International Symposium | |
| Applied Surface Science | Thursday Sessions |
| Session AS+TF-ThA |
| Session: | Thin Film Characterization II |
| Presenter: | Y. Yun, Carnegie Mellon University |
| Authors: | Y. Yun, Carnegie Mellon University A.J. Gellman, Carnegie Mellon University |
| Correspondent: | Click to Email |