| AVS 52nd International Symposium | |
| Applied Surface Science | Thursday Sessions |
| Session AS+TF-ThA |
| Session: | Thin Film Characterization II |
| Presenter: | M. Yoshimura, Toyota Technological Institute, Japan |
| Authors: | M. Yoshimura, Toyota Technological Institute, Japan S. Komaru, Toyota Technological Institute, Japan K. Ueda, Toyota Technological Institute, Japan |
| Correspondent: | Click to Email |