| AVS 49th International Symposium | |
| Applied Surface Science | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | AS-TuA1 Using Gold Liquid Metal Ion Sources for Imaging ToF-SIMS A.V. Walker, N. Winograd, Pennsylvania State University |
| 2:20pm | AS-TuA2 Molecular Imaging Using Atomic and Molecular Primary Ions F. Kollmer, R. Moellers, D. Rading, ION-TOF GmbH, Germany, R. Kersting, TASCON GmbH, Germany, E. Niehuis, ION-TOF GmbH, Germany |
| 2:40pm | AS-TuA3 Topographic Effects in SIMS Imaging S. Rangarajan, B.J. Tyler, University of Utah |
| 3:00pm | AS-TuA4 Towards Quantitative Chemical State XPS Imaging C.J. Blomfield, S. Page, A.J. Roberts, S.J. Hutton, Kratos Analytical Ltd, UK |
| 3:20pm | AS-TuA5 Analysis Area and Sample Area Viewed by the Analyzer in a Scanning Auger Microscope C.J. Powell, S.A. Wight, J.T. Armstrong, National Institute of Standards and Technology |
| 3:40pm | AS-TuA6 Invited Paper Materials Characterization using High Spatial Resolution XPS: Multi-technique, Multi-variate, Multi-collaborator Analyses J.E. Fulghum, University of New Mexico |
| 4:20pm | AS-TuA8 Nano-XAS and Nano-XPS: Energy-discriminating Imaging Utilizing a PEEM Lens Combined with Retarding or Dispersive Electron Energy Filters M. Merkel, M. Escher, J. Settemeyer, M. Schicketanz, T. Unger, FOCUS GmbH, Germany, D. Funnemann, J. Westermann, B. Krömker, OMICRON GmbH, Germany, Ch. Ziethen, A. Oelsner, P. Bernhard, F. Wegelin, A. Krasyuk, G. Schönhense, Johannes Gutenberg Universität, Germany |
| 4:40pm | AS-TuA9 Imaging Thin Oxide-Covered Metal Lines with the Photoelectron Emission Microscope* V.W. Ballarotto, K. Siegrist, M. Breban, E.D. Williams, University of Maryland |