IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11)
    Surface Science Wednesday Sessions

Session SS1-WeA
New Opportunities in Surface Microscopy

Wednesday, October 31, 2001, 2:00 pm, Room 120
Moderator: C.S. Fadley, Lawrence Berkeley National Laboratory


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

2:00pm SS1-WeA1
Imaging with Helium Atoms: Developments in Scanning Atom Microscopy
D.A. MacLaren, W. Allison, University of Cambridge, U.K.
2:20pm SS1-WeA2
Scanning Near-Field Infrared Microscopy
E.S. Gillman, Jefferson Lab
2:40pm SS1-WeA3 Invited Paper
Spectroscopy, Microscopy, and Chemistry at the Spatial Limit
W. Ho, University of California, Irvine, M. Persson, Chalmers University, Sweden
3:40pm SS1-WeA6
Focused Inelasticity in Scanning Tunneling Spectroscopy
J.W. Gadzuk, National Institute of Standards and Technology, M. Plihal, KLA-Tencor
4:00pm SS1-WeA7
Calculations of Elastic and Vibrational Inelastic Electron Tunneling Images
M. Persson, F. Olsson, Chalmers University, Sweden, N. Lorente, IRSAMC, Univ. P. Sabatier Touluose, France
4:40pm SS1-WeA9
Progress in Dynamic Force Microscopy: From High-Resolution Imaging of Insulators to the Measurement of Dissipative Interaction Forces
U.D. Schwarz, H. Hölscher, W. Allers, S. Langkat, University of Hamburg, Germany, B. Gotsmann, H. Fuchs, University of Münster, Germany, R. Wiesendanger, University of Hamburg, Germany
5:00pm SS1-WeA10
Characterization of Structure Transition in Ion-Implanted Amorphous Silicon
J.-Y. Cheng, University of Illinois at Urbana-Champaign, J.M. Gibson, P.M. Baldo, Argonne National Laboratory