| IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11) | |
| Applied Surface Analysis | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AS-TuM1 Invited Paper Chemical Specific Imaging and Micro-spectroscopy of Metal/Semiconductor Interfaces M. Kiskinova, Sincrotrone Trieste, Italy |
| 9:00am | AS-TuM3 The Combination of a Laboratory X-ray Source with an Energy Filtered Bolt-on PEEM Optics: An Innovative Approach Towards Micro-XPS Instrumentation of the Future M. Merkel, M. Escher, Th. Kammler, J. Settemeyer, FOCUS GmbH, Germany, D. Funnemann, B. Gottschlich, OMICRON GmbH, Germany, M. Klais, A. Oelsner, Ch. Ziethen, G. Schönhense, Johannes Gutenberg Universität, Germany |
| 9:20am | AS-TuM4 High Spatial and Spectral Resolution XPS Analysis of Pseudo-Aluminium Alloy Corrosion Sensors C.J. Blomfield, Kratos Analytical Ltd, UK, S.J. Harris, M.C. Hebbron, C.C. Figgures, L.A. Brimecombe, British Aerospace, UK |
| 9:40am | AS-TuM5 Correlation of High Spatial Resolution XPS Imaging with Phase Contrast AFM using Classification Methods J.E. Fulghum, K. Artyushkova, J. Farrar, Kent State University, D. Surman, Kratos Analytical, Inc., S. Page, Kratos Analytical, UK |
| 10:00am | AS-TuM6 Invited Paper Progress in Scanning Tunneling Microscopy at Solid / Liquid Interfaces K. Wandelt, Universität Bonn, Germany |
| 10:40am | AS-TuM8 Solvent-Assisted Modification of Polymer Surfaces Using Scanning Force Microscopy F. Stevens, R. Leach, J.T. Dickinson, Washington State University |
| 11:00am | AS-TuM9 AFM Sample Averaging M. Hasselblatt, University of California at Davis, E.M. Bradbury, Los Alamos National Laboratory |
| 11:20am | AS-TuM10 Study on Modification of Hydrogen Trap Site in Nickel and Stainless Steel Using Atom Probe T. Yoshimura, Hitachi, Ltd., Japan, Y. Ishikawa, Yokohama National University, Japan |