IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11)
    Applied Surface Analysis Tuesday Sessions
       Session AS-TuM

Paper AS-TuM4
High Spatial and Spectral Resolution XPS Analysis of Pseudo-Aluminium Alloy Corrosion Sensors

Tuesday, October 30, 2001, 9:20 am, Room 134

Session: High Spatial Resolution and Imaging
Presenter: C.J. Blomfield, Kratos Analytical Ltd, UK
Authors: C.J. Blomfield, Kratos Analytical Ltd, UK
S.J. Harris, British Aerospace, UK
M.C. Hebbron, British Aerospace, UK
C.C. Figgures, British Aerospace, UK
L.A. Brimecombe, British Aerospace, UK
Correspondent: Click to Email
Due to increased aircraft lifetimes and a move towards the use of chrome free protective coatings, corrosion sensors will be used to monitor future aircraft structures. These may be based upon pseudo aluminium alloy structures, which will be used to assess the localised corrosion in the airframe. The paper desribes the analysis of a selection of reference materials and actual corrosion sensors (PLR and Galvanic) following corrosion testing. XPS was used to study the distribution of the corrosion products around the sensor and to identify the composition of the surface of the sensors post testing. A combination of both high spatial resolution XPS imaging and small area XPS analysis were used to analyse to sensors fabricated on high resistance silicon and kapton.