IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11)
    Applied Surface Analysis Tuesday Sessions
       Session AS-TuM

Paper AS-TuM5
Correlation of High Spatial Resolution XPS Imaging with Phase Contrast AFM using Classification Methods

Tuesday, October 30, 2001, 9:40 am, Room 134

Session: High Spatial Resolution and Imaging
Presenter: J.E. Fulghum, Kent State University
Authors: J.E. Fulghum, Kent State University
K. Artyushkova, Kent State University
J. Farrar, Kent State University
D. Surman, Kratos Analytical, Inc.
S. Page, Kratos Analytical, UK
Correspondent: Click to Email
Understanding the surface morphology of heterogeneous organic samples can require the use of several different imaging, as well as spectroscopic, techniques. Even if the techniques have a comparable field of view, correlating data can be difficult since the imaging methods are likely to have different spatial resolutions, sampling depths, sample preparation requirements, damage mechanisms, and data interpretation considerations. Spatial resolution in laboratory-based XPS imaging instruments is now approaching the sub-micron scale. As the XPS spatial resolution improves, correlations with microscopic techniques such as AFM become potentially possible. We will discuss methods for correlating the chemical information in photoelectron images with the phases identified through phase contrast AFM. Image classification methods can be used to identify and compare components in photoelectron and AFM images. Results for both polymer grids and heterogeneous polymer blends will be discussed. This work has been partially supported by NSF ALCOM (DMR89-20147).