| IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11) | |
| Applied Surface Analysis | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| AS-MoP1 Vesicle to Supported Bilayer Transformation Kinetics; Influence from Vesicle Size, Temperature and Surface Support E. Reimhult, K. Dimitrievski, V.P. Zhdanov, F. Höök, B. Kasemo, Chalmers University of Technology, Sweden |
| AS-MoP2 Thermal and Electron-beam Irradiation Effects on the Surfaces of Niobium@footnote 1@ Q. Ma, R.A. Rosenberg, Argonne National Laboratory |
| AS-MoP3 Determination of In-Depth Profiles Using Deconvolution of Angle Dependent XPS: Model Systems and Copolymer Surface Compositions C.M. Mahoney, State University of New York at Buffalo, J. Elman, Eastman Kodak, J.A. Gardella, Jr., State University of New York at Buffalo |
| AS-MoP4 Defect Layer Detection at the Surface of Polycrystalline Cu(In,Ga)Se@sub2@ by SIMS Depth Profiling, AES, SEM and TEM S.E. Asher, F.S. Hasoon, H. Althani, K.M. Jones, C.L. Perkins, M.R. Young, NREL |
| AS-MoP5 Charged Layer Calculation for an Effective Surface/Interface Analysis of Insulating Oxides using AES S. Wannaparhun, S. Seal, V. Desai, K. Scammon, Z. Rahman, University of Central Florida |
| AS-MoP7 Innovative Design of a Temperature Controlled Sample Holder D. Castro Alves, O.M.N.D. Teodoro, A.M.C. Moutinho, New University of Lisbon, Portugal |
| AS-MoP8 TOF-SIMS and XPS Characterisation of Novel Perfluoropolyether-urethane Ionomers from Aqueous Dispersions R. Canteri, G. Speranza, M. Anderle, ITC-IRST, Italy, S. Turri, S. Radice, Ausimont SpA, Italy |
| AS-MoP9 Experimental vs. Theoretical Studies of Amine Reaction Pathways on Si(100) A.J. Carman, S.M. Casey, University of Nevada, Reno |
| AS-MoP10 TOF-SIMS and Laser-SNMS Characterization of Cell Cultures and Tissue Material M. Fartmann, S. Dambach, Universität Münster, Germany, A. Wittig, W. Sauerwein, Universitätsklinikum Essen, Germany, H.P. Wiesmann, Klinik und Poliklinik für Mund-, Kiefer- und Gesichtschirurgie Münster, Germany, H.F. Arlinghaus, Universität Münster, Germany |
| AS-MoP12 Evaluation of the Surface Morphology of Chemically Treated Fluorides by AFM M. Suzuki, Tohoku Institute of Technology, Japan |
| AS-MoP13 Impurity Dopant Profile Measurement and Quantization in sub-100nm Region E.-S. Kang, H.-J. Hwang, Chung-Ang University, Korea, G.-Y. Lee, Samchok National University, Korea |
| AS-MoP14 Non-destructive Testing of Mechanical Properties of Thin Films below 100 nm with Laser-acoustic Waves T. Schuelke, D. Schneider, B. Schultrich, Fraunhofer Institute for Materials and Beam Technology |
| AS-MoP15 Atomic-Scale Modeling of Plasma Enhanced Chemical Vapor Deposition of Hydrogenated Amorphous Silicon Thin Films S. Sriraman, S. Ramalingam, E.S. Aydil, D. Maroudas, University of California, Santa Barbara |