IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11), Session AS-MoM

IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11)
Applied Surface Analysis	Monday Sessions

Session AS-MoM
Quantitative Analysis and Data Interpretation I: SIMS

Click a paper to see the details. Presenters are shown in bold type.

9:40am	AS-MoM1 TOF-SIMS Characterization of Additives in Polymer Materials: Influence of Primary Ion Bombardment Conditions R. Kersting, B. Hagenhoff, TASCON GmbH, Germany
10:00am	AS-MoM2 ToF-SIMS Surface Chemical State Imaging of Biomaterials B.T. Wickes, D.G. Castner, University of Washington
10:20am	AS-MoM3 Application of Spectrum Imaging and Multivariate Statistical Analysis to Time-of-Flight Secondary Ion Mass Spectrometry@footnote 1@ J.A. Ohlhausen, M.R. Keenan, D.E. Peebles, P.G. Kotula, Sandia National Laboratories
10:40am	AS-MoM4 Multivariate Statistical Approaches for Distinguishing Between Chemical and Topographical Features in TOF-SIMS Images B.J. Tyler, University of Utah
11:00am	AS-MoM5 Invited Paper Data Interpretation and Quantitative Analysis - A Global Approach in Static SIMS I.S. Gilmore, M.P. Seah, National Physical Laboratory, UK
11:40am	AS-MoM7 Secondary Ion Mass Spectrometry Analysis of Wafer Contamination Resulting from Gloved Hands W.R. Morinville, C. Blackmer, Micron Technology, Inc.