IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11)
    Plasma Science Wednesday Sessions
       Session PS2-WeM

Paper PS2-WeM1
Time-Dependent Electron Impact Source Functions in Inductive and Capacitive Plasma Sources Obtained Using an "On-The-Fly" Monte-Carlo Technique@footnote 1@

Wednesday, October 31, 2001, 8:20 am, Room 104

Session: Modeling
Presenter: A. Sankaran, University of Illinois
Authors: A. Sankaran, University of Illinois
M.J. Kushner, University of Illinois
Correspondent: Click to Email

Electron temperatures in low-pressure inductively and capacitively coupled plasma reactors do not significantly vary during the rf cycle. There can be, however, considerable modulation of rate coefficients and source functions for electron impact reactions having high threshold due to modulation in the tail of the electron energy distribution at energies which are less collisional. Since the character of this modulation requires that the electron energy distribution (EED) be resolved, we developed a new "On-the-Fly" (OTF) Monte-Carlo technique to compute the time dependent properties of EEDs. Using this method, Fourier frequency coefficients of the moments of the EEDs are obtained as a function of position in the reactor. The time dependence of the resulting electron impact processes are then reconstructed as a time series. The OTF method was incorporated into the Electron Monte Carlo module of a 2-dimensional plasma equipment model. The time and spatial variation of low and high threshold processes in rare gas/molecular gas mixtures will be discussed, comparing systematic trends in ICP, capacitive and helicon plasma sources. In ICPs, we found that time dependence of high threshold events such as ionization are dominated by even harmonics, whereas in asymmetric CCPs, odd harmonics are also important. The harmonic content of sources increases with increasing threshold energy and pressure. @FootnoteText@ @footnote 1@Work supported by NSF, SRC and Applied Materials