AVS 47th International Symposium
    Semiconductors Friday Sessions

Session SC+EL-FrM
III-Nitride Processing and Devices

Friday, October 6, 2000, 8:20 am, Room 306
Moderator: D.D. Koleske, Naval Research Laboratory


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:20am SC+EL-FrM1
Process Development For Small-Area GaN/AlGaN HBTs
K.P. Lee, G. Dang, A.P. Zhang, F. Ren, University of Florida, J. Han, Sandia National Laboratories, W.S. Hobson, Lucent Technologies, Bell Laboratories, C.R. Abernathy, S.J. Pearton, University of Florida, J.W. Lee, Plasma Therm
8:40am SC+EL-FrM2
Morphology on HDP-Etched III-Nitride Materials
T.-N. Kuo, J.-H. Yeh, H.-J. Lee, C.-A. Chen, D.G.-K. Jeng, Nano-Architect Research Corporation, Taiwan
9:00am SC+EL-FrM3
Effects of Etch Processing on Contacts to n-GaN
R. Singh, C.R. Eddy, Jr., Boston University, H.M. Ng, Lucent Technologies, T.D. Moustakas, Boston University
9:20am SC+EL-FrM4 Invited Paper
Growth of Ga(In)NAs/GaAs Alloys by Plasma-Assisted Molecular Beam Epitaxy
A.L. Holmes, Jr., University of Texas at Austin
10:00am SC+EL-FrM6
Field Electron Emission and Surface Properties of as-grown and Modified AlGaN Films
A. Bensaoula, I. Berishev, E. Kim, University of Houston, M. Ugarov, V. Ageev, E. Loubnin, A. Karabutov, General Physics Institute, Russia, A. Tempez, University of Houston
10:20am SC+EL-FrM7
Effect of Annealing and Carbon Concentration on the PL Intensity from GaN:Er and GaN:Eu
M.E. Overberg, C.R. Abernathy, S.J. Pearton, University of Florida, J.M. Zavada, U.S. Army European Research Office, UK
10:40am SC+EL-FrM8 Invited Paper
Probing Nanoscale Electronic Properties in Nitride Semiconductor Heterostructures
E.T. Yu, K.V. Smith, X.Z. Dang, University of California, San Diego
11:20am SC+EL-FrM10
GaN and AlGaN Power Rectifiers
A.P. Zhang, G. Dang, F. Ren, X.A. Cao, K.P. Lee, S.J. Pearton, University of Florida, J. Han, Sandia National Laboratories, J.I. Chyi, National Central University,Taiwan, C.M. Lee, C.C. Chuo, National Central University, Taiwan
11:40am SC+EL-FrM11
Growth and Characterization of Gadolinium Oxide Gate Dielectric on Gallium Nitride
B.P. Gila, K.N. Lee, K.K. Harris, W. Johnson, V. Krishnamoorthy, C.R. Abernathy, F. Ren, S.J. Pearton, University of Florida