AVS 47th International Symposium
    Processing at the Nanoscale/NANO 6 Wednesday Sessions
       Session NS+NANO6+MC-WeM

Paper NS+NANO6+MC-WeM6
Simultaneous STM/nc-AFM Imaging and Force Spectroscopy of Si(100)-(2x1) Surface with Small Oscillation Amplitudes

Wednesday, October 4, 2000, 10:00 am, Room 302

Session: Nanomechanical and Interface Measurements
Presenter: H.O. Ozer, Bilkent University, Turkey
Authors: H.O. Ozer, Bilkent University, Turkey
A. Oral, Bilkent University, Turkey
J.B. Pethica, University of Oxford, UK
Correspondent: Click to Email
We have used a new, fiber interferometer based, high force resolution nc-AFM to image the Si(100)(2x1) surface with atomic resolution, using very small tip oscillation amplitudes down to 0.5 ?pp. The lever is dithered with the small oscillation amplitude at a frequency below resonance and the changes in the oscillation amplitude recorded simultaneously with force gradient and STM topography. With this method we can measure the force gradients quantitatively. Simultaneous images of Force gradient and STM topography have been recorded as a function of tunnel current and bias voltage. The effect of tunnel current and bias voltage on the force gradient contrast will be presented. We have also present force-distance curves between tip and Si(100) surface, measured with sub-Angstrom oscillation amplitudes.