AVS 47th International Symposium
    Processing at the Nanoscale/NANO 6 Thursday Sessions

Session NS+NANO6+MC-ThA
Near-field Optics and Photonics

Thursday, October 5, 2000, 2:00 pm, Room 302
Moderator: Y. Kuk, Seoul National University, Korea


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

2:00pm NS+NANO6+MC-ThA1 Invited Paper
Optical Sieves - How to Get the Light through Subwavelength Holes
T.W. Ebbesen, Louis Pasteur University, France
2:40pm NS+NANO6+MC-ThA3
Near-field Optical Measurements of Two Types of the Super-resolution Near-field Structures
D.P. Tsai, W.C. Lin, National Taiwan University
3:00pm NS+NANO6+MC-ThA4
Near Field Surface Photovoltage Microscopy
R. Shikler, S. Saraf, Y. Rosenwaks, Tel-Aviv University, Israel
3:20pm NS+NANO6+MC-ThA5
Dual-Wavelength Scanning Near-Field Optical Microscopy
P.R. LeBlanc, M. Gu, P. Grutter, D.G. Gray, McGill University, Canada
3:40pm NS+NANO6+MC-ThA6
Novel Scanning Near-field Optical Spectroscopy/Atomic Force Microscope Probes with High Polarisation Single/Double Slit and Cross Aperture Tips
H.P. Zhou, G. Mills, L. Donaldson, J.M.R. Weaver, University of Glasgow, UK
4:00pm NS+NANO6+MC-ThA7
Optical Properties of Strained GaInP/InP Quantum Dots Studied with STM Based Electro-luminescence
M.K.-J. Johansson, U. Hakanson, J. Johansson, M.-E. Pistol, L. Montelius, L. Samuelson, Lund University, Sweden
4:20pm NS+NANO6+MC-ThA8
Silicon Nanostructures via Intense Ultrafast Electronic Excitation
A.V. Hamza, M.W. Newman, University of California, Lawrence Livermore National Laboratory, T. Schenkel, University of California, Lawrence Berkeley National Laboratory, H.W.H. Lee, P. Thielen, J.W. McDonald, D.H. Schneider, University of California, Lawrence Livermore National Laboratory
4:40pm NS+NANO6+MC-ThA9
Microstructural and Optical Properties of Porous SiC
S. Zangooie, University of Nebraska, Lincoln, H. Arwin, Linkoping University, Sweden, J.A. Woollam, University of Nebraska, Lincoln
5:00pm NS+NANO6+MC-ThA10
Development of a Photon Detection STM for Inelastic Light Emission
D. Fujita, W.-L. Deng, T. Ohgi, K. Ishige, National Research Institute for Metals, Japan