AVS 47th International Symposium
    Material Characterization Wednesday Sessions
       Session MC-WeM

Paper MC-WeM7
Z-dol PFPEs on Magnetic Recording Disks: A PLS Study of TOF-SIMS Spectra

Wednesday, October 4, 2000, 10:20 am, Room 207

Session: Methods of Data Analysis
Presenter: A. Spool, IBM Corporation
Authors: A. Spool, IBM Corporation
K. Kuboi, IBM Corporation
R. Waltman, IBM Corporation
P. Kasai, IBM Corporation
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Statistical methods were used to show how variations in the peak intensities in the TOF-SIMS spectra of Z-dol Perfluoropolyether (PFPE) lubricant deposited on magnetic recording disks vary with the properties of the lubricant. Partial Least Squares analysis of a large number of spectra successfully modeled variations in lubricant thickness, molecular weight and the ratio of the 2 main repeating units in the Z-dol copolymer. The peaks of most significance (largest absolute regression factor) for each model were then examined to relate fragment structures to the physical property being modeled. This in turn was used to further our understanding@footnote 1,2@ of the spectra themselves. @FootnoteText@ @footnote 1@ A. M. Spool and P. Kasai, Macromolecules 29, 1691 (1996). @footnote 2@ P. H. Kasai and A. M. Spool, J. Phys. Chem. B 102, 7331 (1998).