| AVS 47th International Symposium | |
| Material Characterization | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | MC-ThM1 Invited Paper Quantification of Polymer Surface Composition Based on ToF-SIMS Data P. Bertrand, Université Catholique de Louvain, Belgium |
| 9:00am | MC-ThM3 Characterisation of Polymer Additives by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) R. Kersting, B. Hagenhoff, TASCON GmbH, Germany, D. Rading, E. Niehuis, ION-TOF GmbH, Germany |
| 9:20am | MC-ThM4 Surface Composition of Poly(imidesiloxane) Copolymers Containing Multiple Siloxane Lengths C.M. Mahoney, State University of New York at Buffalo, J Rosenfeld, S.R. Rojstaczer, Occidental Chemical Corporation, J.A. Gardella, State University of New York at Buffalo |
| 9:40am | MC-ThM5 High Spatial Resolution XPS and FTIR: An Approach to 3-D Characterization of Polymer Blends K. Artyushkova, G. Czwerniec, J.E. Fulghum, Kent State University, B. Wall, J. Koenig, Case Western Reserve University |
| 10:00am | MC-ThM6 Iron Metallization of Fluorinated Organic Films; A Combined XPS and AFM Study S.R. Carlo, A.J. Wagner, D.H. Fairbrother, Johns Hopkins University |
| 10:20am | MC-ThM7 Interactions of Cu(I) with the Surface of a Novel Poly(imidazole) A.L. Marsh, D.J. Burnett, University of Michigan, D.A. Fischer, National Institute of Standards and Technology, P.G. Rasmussen, J.L. Gland, University of Michigan |
| 10:40am | MC-ThM8 Study of Semicrystalline Poly(ethylene terephthalate) by Atomic Force Microscopy M. Kovar, U. Gorodzinsky, P.R. Norton, University of Western Ontario, Canada |
| 11:00am | MC-ThM9 Morphology of Catalytically Formed Polyethylene on a Planar Model System for the Phillips (CrOx / SiO2) Catalyst P.C. Thuene, J. Loos, P.J. Lemstra, J.W. Niemantsverdriet, Eindhoven University of Technology, The Netherlands |
| 11:20am | MC-ThM10 Nano-Mechanics of Polymer Surfaces C. Steffan, H. Liu, R.M. Winter, South Dakota School of Mines and Technology |