AVS 47th International Symposium
    Material Characterization Thursday Sessions
       Session MC-ThM

Paper MC-ThM3
Characterisation of Polymer Additives by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Thursday, October 5, 2000, 9:00 am, Room 207

Session: Polymer Characterization
Presenter: R. Kersting, TASCON GmbH, Germany
Authors: R. Kersting, TASCON GmbH, Germany
B. Hagenhoff, TASCON GmbH, Germany
D. Rading, ION-TOF GmbH, Germany
E. Niehuis, ION-TOF GmbH, Germany
Correspondent: Click to Email
In continuation of our ongoing studies concerning the characterisation of polymer additives in their respective host polymers we have concentrated on the investigation of the influence of the primary ion parameters on the emission behaviour of characteristic additive ions. The additives, mostly antioxidants, were incorporated into low densitiy polyethylene (LDPE) or spin coated onto virgin LDPE in concentrations between approx. 500 and 2000 ppm. Thus ion emission from thick polymer materials could be studied. Reference samples without the polymer host were prepared by spin coating the additives onto bare Si wafers. Both, monoatomic (Ga@super +@, Au@super +@) and polyatomic (SF@sub 5@@super +@, Au@sub 2@@super +@) ions were used for sample excitation. Additionally, the energy of the respective primary ions was varied between 1 and 10 keV. The talk will describe the influence of the respective primary ion parameter onto yield and efficiency of the desorbed secondary ions. The consequences for the quantification of polymer additives in "real world" samples will also be discussed.