AVS 47th International Symposium
    Material Characterization Thursday Sessions
       Session MC-ThM

Paper MC-ThM6
Iron Metallization of Fluorinated Organic Films; A Combined XPS and AFM Study

Thursday, October 5, 2000, 10:00 am, Room 207

Session: Polymer Characterization
Presenter: S.R. Carlo, Johns Hopkins University
Authors: S.R. Carlo, Johns Hopkins University
A.J. Wagner, Johns Hopkins University
D.H. Fairbrother, Johns Hopkins University
Correspondent: Click to Email
The evolution of the metal-organic interface during iron mediated metallization of fluorinated organic surfaces has been studied using X-ray Photoelectron Spectroscopy (XPS) and Atomic Force Microscopy (AFM). Poly(tetrafluoroethylene) (PTFE) and a semi-fluorinated self-assembled monolayer (CF@sub3@(CF@sub2@)@sub7@(CH@sub2@)@sub2@SH, CF-SAMs) formed on Au were used as substrates. Reaction of Fe resulted in defluorination of each film, production of a carbonaceous overlayer and exclusive formation of iron (II) fluoride. A metallic iron overlayer was formed concurrently with FeF2 during deposition on CF-SAMs and following extended iron exposures with PTFE substrates. X-ray treatment of metallized PTFE caused an increase of the FeF@sub2@ content in the metal-organic region. Ex-situ AFM measurements revealed that the frictional characteristics of the surface increase during the initial stages of metallization associated with defluorination and FeF@sub2@ formation. At higher Fe exposures the surface friction decreased as a metallic overlayer evolved. Results of metallization using other metals will also be presented.