AVS 47th International Symposium | |
Thin Films | Wednesday Sessions |
Session TF+EL-WeA |
Session: | In-situ Characterization of Thin Film Growth |
Presenter: | A. Böttcher, Fritz-Haber-Institut, Germany |
Authors: | A. Böttcher, Fritz-Haber-Institut, Germany B. Krenzer, Fritz-Haber-Institut, Germany W. Stenzel, Fritz-Haber-Institut, Germany H. Conrad, Fritz-Haber-Institut, Germany H. Niehus, Humboldt-Universität, Germany |
Correspondent: | Click to Email |