AVS 46th International Symposium
    Plasma Science and Technology Division Friday Sessions

Session PS-FrM
Emerging Plasma Applications

Friday, October 29, 1999, 8:20 am, Room 609
Moderator: W.M. Holber, Applied Science and Technology, Inc.


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:20am PS-FrM1 Invited Paper
Plasma Doping for Shallow Junctions
S.B. Felch, M.J. Goeckner, Z. Fang, Varian Semiconductor Equipment Associates, G.C.-F. Yeap, D. Bang, M.-R. Lin, AMD Inc.
9:00am PS-FrM3
Sputter-Wind Heating in Ionized Metal PVD@footnote 1@
J. Lu, M.J. Kushner, University of Illinois, Urbana
9:20am PS-FrM4 Invited Paper
Opportunities and Challenges for Plasma Processes in MEMS Fabrication
J.J. Sniegowski, Sandia National Laboratories
10:00am PS-FrM6
200 mm SCALPEL@super TM@ Mask Dry Etch Development
G.R. Bogart, A. Kornblit, Lucent Technologies, I. Johnston, Surface Technology Systems, UK, A.E. Novembre, M.L. Peabody, C.S. Knurek, R.J. Kasica, Lucent Technologies
10:20am PS-FrM7
High Anisotropy Etching of 0.18 Micron Platinum Electrodes
S.D. Athavale, D.E. Kotecki, IBM, Microelectronics Division, H. Shen, Siemens, J. Hwang, C. Ying, D.J. Lee, S. Mak, Applied Materials, Inc.
10:40am PS-FrM8
Real Time Control of Plasma Tools During Recipe Changes and Transients@footnote 1@
M.J. Kushner, University of Illinois, Urbana, S. Rauf, Motorola Inc.
11:00am PS-FrM9
Plasma Injection with Small Helicon Sources
F.F. Chen, University of California, Los Angeles, X. Jiang, Broadcom, Inc.
11:20am PS-FrM10
Ultra-Low-Temperature Formation of Silicon Nitride Gate Dielectric Films by Novel Plasma Technique
M. Hori, H. Ohta, A. Nagashima, Nagoya University, Japan, M. Ito, Wakayama University, Japan, T. Goto, Nagoya University, Japan
11:40am PS-FrM11
Characterizations of a Compact, Low-Field Toroidal Plasma Source for Downstream Plasma Processing
X. Chen, W.M. Holber, D.K. Smith, Applied Science and Technology, Inc., M.G. Blain, R.L. Jarecki, Sandia National Laboratories