| AVS 46th International Symposium | |
| Applied Surface Science Division | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | AS-ThA1 Invited Paper Conformation and Orientation Effects in the XPS Spectra of Thin Polymer Films G. Beamson, Daresbury Laboratory, U.K. |
| 2:40pm | AS-ThA3 Correlative XPS and FTIR Imaging Analysis of Polymer Blends J.E. Fulghum, K. Artyushkova, A.C. Ferryman, Kent State University, J.L. Koenig, Case Western Reserve University |
| 3:00pm | AS-ThA4 Beam Induced Damage Effects in XPS Studies of Thin Organic Films H. Cohen, R. Maoz, E. Frydman, J. Sagiv, The Weizmann Inst. of Science, Israel |
| 3:20pm | AS-ThA5 Surface Analysis of Nitrogen Plasma-Treated Poly (ethylene-2,6-naphthalate) Films using XPS and Gas Phase Derivatization Reactions Y. Liu, L. Gerenser, Eastman Kodak Company |
| 3:40pm | AS-ThA6 Quantitative Analysis of Functional Groups with TOF-SIMS T. Fladung, D. Wolany, T. Gantenfort, L. Wiedmann, A. Benninghoven, Universität Münster, Germany |
| 4:00pm | AS-ThA7 Determination of Helical Conformation Effects in PTFE NEXAFS Spectra with FEFF8 Calculations D.G. Castner, L. Gamble, University of Washington, D.A. Fischer, B. Ravel, National Institute of Standards and Technology |
| 4:20pm | AS-ThA8 Monitoring the Kinetics of Migration/ Absorption/ Desorption/ and Cross-linking in a Curing Silicone Coating, using the QCM-D Technique P. Dahlqvist, Q-Sense AB, Sweden, M. Rodahl, Chalmers, Sweden, P. Bjoorn, Q-Sense AB, Sweden, M. Berglin, P. Gatenholm, Chalmers, Sweden |
| 4:40pm | AS-ThA9 Angle Resolved XPS Study of Random Fluoro-methacrylate Copolymers W.E. Kosik, S.H. McKnight, J.M. Deitzel, N.C. Beck Tan, Army Research Laboratory |
| 5:00pm | AS-ThA10 Surface Analysis Characterization of Titanium/Sol-Gel/Polyimide Adhesive Systems J.T. Cherian, Boeing Materials Technology & University of Washington, D.G. Castner, University of Washington |