AVS 46th International Symposium
    Applied Surface Science Division Thursday Sessions
       Session AS-ThA

Paper AS-ThA4
Beam Induced Damage Effects in XPS Studies of Thin Organic Films

Thursday, October 28, 1999, 3:00 pm, Room 6A

Session: Polymer Surfaces, Films, and Interfaces
Presenter: H. Cohen, The Weizmann Inst. of Science, Israel
Authors: H. Cohen, The Weizmann Inst. of Science, Israel
R. Maoz, The Weizmann Inst. of Science, Israel
E. Frydman, The Weizmann Inst. of Science, Israel
J. Sagiv, The Weizmann Inst. of Science, Israel
Correspondent: Click to Email
Beam induced irreversible effects are frequently overlooked in XPS studies of thin organic films, mainly because of limitations in self testing capabilities of the technique. Minimization of such effects requires elaborated experimental procedures, and a fundamental understanding of the dominant damage mechanisms. Aiming at this goal, a thorough study of X-ray induced effects in layered self assembled organic films has been conducted using a number of complementary techniques, additional to the in-situ XPS measurements. Chemical functions particularly sensitive to the X-ray radiation have been identified. Structural and chemical modifications are discussed as a function of the initial film composition, and their significance for potential applications is indicated.