AVS 46th International Symposium
    Applied Surface Science Division Thursday Sessions
       Session AS-ThA

Paper AS-ThA3
Correlative XPS and FTIR Imaging Analysis of Polymer Blends

Thursday, October 28, 1999, 2:40 pm, Room 6A

Session: Polymer Surfaces, Films, and Interfaces
Presenter: J.E. Fulghum, Kent State University
Authors: J.E. Fulghum, Kent State University
K. Artyushkova, Kent State University
A.C. Ferryman, Kent State University
J.L. Koenig, Case Western Reserve University
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Phase segregation in blends of poly(vinyl chloride) and poly(methyl methacrylate) has been evaluated through correlation of photoelectron and infra-red images and small area spectra. Polymer surfaces which are heterogeneous on the scale of microns can be characterized by XPS if both imaging and small area spectroscopy are utilized. Polymer compositions in the bulk phase are routinely evaluated using FTIR spectroscopy. In this study, we take advantage of recent advances in the imaging capabilities of both techniques to improve characterization of heterogeneous organic samples. Surface-specific chemical information was acquired using a Kratos AXIS Ultra photoelectron spectrometer, while phase-segregation in the bulk was studied using a Biorad Stingray FTIR microscope. Images of comparable spatial resolution are readily obtained, allowing for a more complete characterization of lateral and vertical phase segregation than is possible with a single spectroscopic technique. Core and valence band XPS determinations of polymer blend composition in phase-separated regions will be compared to results based on small-area FTIR spectra. This work has been partially supported by NSF DMR89-20147 and 3M.