AVS 45th International Symposium
    Selected Energy Epitaxy Topical Conference Thursday Sessions

Session SE-ThM
In Situ Characterization and Real-Time Diagnostics of Surface Growth Processes

Thursday, November 5, 1998, 8:20 am, Room 327
Moderator: R.D. Tromp, IBM T.J. Watson Research Center


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Click a paper to see the details. Presenters are shown in bold type.

8:20am SE-ThM1 Invited Paper
Low Energy Electron Microscopy of SEED Growth of GaN Layers
A. Pavlovska, E. Bauer, I.S.T. Tsong, V.M. Torres, R.B. Doak, Arizona State University
9:00am SE-ThM3 Invited Paper
Observation and Nucleation Control of Ge Growth on Si Surfaces using Scanning Reflection Electron Microscopy
M. Ichikawa, Joint Research Center for Atom Technology, Japan
9:40am SE-ThM5 Invited Paper
Wurtzite GaN Surface Structure Studied by Scanning Tunneling Microscopy and Total Energy Calculations
A.R. Smith, R.M. Feenstra, D.W. Greve, M.-S. Shin, M. Skowronski, Carnegie Mellon University, J. Neugebauer, Fritz-Haber-Institut der MPG, Germany, J.E. Northrup, Xerox Palo Alto Research Center
10:20am SE-ThM7 Invited Paper
Low-Energy Electron Microscopy of (0001) Surfaces of GaN Films@footnote 1,2@
M.G. Lagally, University of Wisconsin, Madison
11:00am SE-ThM9
Defect-Driven Nucleation Kinetics of GaN Growth on Sapphire(0001)
A.R. Woll, J.D. Brock, R.L. Headrick, S. Kycia, Cornell University
11:20am SE-ThM10 Invited Paper
Site-Selective Reaction of Br@sub 2@ with the Second Layer Ga Atoms on the As-rich GaAs(001)-2x4 Surface
Y. Liu, A.J. Komrowski, A.C. Kummel, University of California, San Diego