AVS 45th International Symposium | |
Selected Energy Epitaxy Topical Conference | Thursday Sessions |
Session SE-ThM |
Session: | In Situ Characterization and Real-Time Diagnostics of Surface Growth Processes |
Presenter: | A.R. Smith, Carnegie Mellon University |
Authors: | A.R. Smith, Carnegie Mellon University R.M. Feenstra, Carnegie Mellon University D.W. Greve, Carnegie Mellon University M.-S. Shin, Carnegie Mellon University M. Skowronski, Carnegie Mellon University J. Neugebauer, Fritz-Haber-Institut der MPG, Germany J.E. Northrup, Xerox Palo Alto Research Center |
Correspondent: | Click to Email |