| AVS 45th International Symposium | |
| Nanometer-scale Science and Technology Division | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| NS-ThP1 A Low Temperature STM System for the Study of Quantum Electronic Systems@footnote 1@ J.A. Stroscio, R.J. Celotta, National Institute of Standards and Technology |
| NS-ThP2 Development of Low-Temperature Ultrahigh-Vacuum Atomic Force Microscope / Scanning Tunneling Microscope (LT-UHV-AFM/STM) Using Two-Stage Coil-Spring Suspension Isolator N. Suehira, K. Sugiyama, Y. Sugawara, S. Morita, Osaka University, Japan |
| NS-ThP3 Characterization of Various SiO@sub2@ by Scanning Capacitance Microscopy G.H. Buh, C.J. Kang, Seoul National University, Korea, K. Mang, Samsung Electronics, Korea, S. Lee, C.K. Kim, C. Im, Y. Kuk, Seoul National University, Korea |
| NS-ThP4 Automated, High Precision Measurement of Critical Dimensions using the Atomic Force Microscope D.A. Chernoff, D.L. Burkhead, Advanced Surface Microscopy, Inc. |
| NS-ThP5 Use of Phase Imaging Tapping Mode AFM to Spatially Resolve Areas of Different Doping Densities on Patterned Si Wafers M.W. Nelson, P.G. Schroeder, R. Schlaf, B.A. Parkinson, Colorado State University |
| NS-ThP6 Metallic Adhesion at the Atomic Scale A. Schirmeisen, G. Cross, P. Grütter, McGill University, Canada, U. Dürig, IBM Research Division, Switzerland |
| NS-ThP7 Tribological Properties of Crystalline Surfaces A.J. Gellman, J.S. Ko, Carnegie Mellon University |
| NS-ThP8 Frictional Force Microscopy Study of Discrete Surface Functional Group Assembled by Langmuir-Blodgett Technique M. Nakamura, A. Shimizu, Y. Nakayama, Y. Nagasawa, Toray Research Center, Inc., Japan |
| NS-ThP9 Quantitave Surface Force Gradient Measurements Using Atomic Force Microscopy L.A.W. Sanderson, M.A. George, J.J. Weimer, University of Alabama, Huntsville |
| NS-ThP10 The Durability of Optical Fiber Probe Tips for Surface Profilometry J.E. Griffith, R. Raghunathan, L.E. Plew, J.B. Bindell, Bell Laboratories, Lucent Technologies, J. Carlson, A. Berghaus, J.J. Plombon, C.E. Bryson, Surface/Interface, Inc. |
| NS-ThP11 Force Measurement of Optical Evanescent Field using Kelvin-Null Method K. Sawada, M. Abe, Y. Sugawara, Y. Andoh, S. Morita, Osaka University, Japan |
| NS-ThP12 Tunneling and Photon Emission of Colloidal Particles G.S. McCarty, C.D. Keating, P.S. Weiss, M.J. Natan, Pennsylvania State University |
| NS-ThP13 Temperature Dependence of the Raman Scattering Spectra in Zn/ZnO Nanoparticles J. Xu, W. Ji, Z.X. Shen, S.-H. Tang, National University of Singapore |
| NS-ThP14 Electromagnetic Coupling Efficiency of a Metal Coated Optical Fiber Tip L. Alvarez, CICESE, Mexico, M. Xiao, UNAM, Mexico |
| NS-ThP15 Annealing Atmosphere and Electron Irradiation Effects on Gold Nanocrystals Buried in MgO A. Ueda, R. Mu, M.H. Wu, D.O. Henderson, Fisk University, R.M. Uribe, Kent State University, A.F. Hepp, E.M. Gordon, NASA Lewis Research Center, C.W. White, J. Budai, A. Meldrum, R.A. Zuhr, Oak Ridge National Laboratory, P. Wang, University of Texas, El Paso |
| NS-ThP18 The Shape Evolution of Patterned Submicron Structures under Thermal and Chemical Activation K.C. Lin, D. Kohn, K. Thuermer, J.E. Reutt-Robey, E.D. Williams, University of Maryland, College Park |
| NS-ThP19 Processing and Characterization of Nanometer Sized Copper Sulfide Particles S. Seal, L. Bracho, C. Urbanik, M. Hampton, University of Central Florida, J. Morgiel, Polish Academy of Science |
| NS-ThP20 Film Formation and the Onset of Multilayer Growth in Chloromethylphenylsilane Films as Determined by Atomic Force Microscopy W.J. Dressick, Naval Research Laboratory, J.M. Calvert, Shipley Co., M.-S. Chen, S.L. Brandow, Naval Research Laboratory |
| NS-ThP21 Room Temperature Fabrication of Transparent ZrO@sub 2@/Polymer Nanocomposite Thin-Films with Controlled Thickness by the Ionic Self-Assembled Monolayer (ISAM) Method A. Rosidian, Y. Liu, R. Claus, Virginia Polytechnic Institute and State University |
| NS-ThP22 Nanowire Formation Using a Resistively-Heated Piezoresistive Cantilever T. Uchihashi, U. Ramsperger, H. Nejoh, National Research Institute for Metals, Japan |
| NS-ThP23 Adsorbate Effect on Conductance Quantization in Metallic Nanowires C.Z. Li, H. Sha, M. Adam, N.J. Tao, Florida International University |
| NS-ThP24 Substrate Effects on Electronic Properties of Atomic Chains T. Yamada, MRJ, NASA Ames Research Center |
| NS-ThP25 Designing New Materials at the Molecular Scale - An Example in Etching and Deposition J.A. Gurney, McGill University, Canada, E.A. Rietman, Bell Laboratories, Lucent Technologies, M.A. Marcus, KLA Instruments, M.P. Andrews, McGill University, Canada |
| NS-ThP26 Spectroscopic Studies of Carbon Nanotube by Ballistic Electron Projection Microscopy J.-Y. Park, S.-H. Kim, Y.D. Suh, W.-G. Park, Y. Kuk, Seoul National University, Korea |
| NS-ThP27 Synchrotron-Radiation-Induced Deposition of Nanocrystalline Particles R.A. Rosenberg, Q. Ma, B. Lai, D.C. Mancini, Argonne National Laboratory |