AVS 45th International Symposium
    Nanometer-scale Science and Technology Division Thursday Sessions
       Session NS-ThP

Paper NS-ThP26
Spectroscopic Studies of Carbon Nanotube by Ballistic Electron Projection Microscopy

Thursday, November 5, 1998, 5:30 pm, Room Hall A

Session: Nanometer-Scale Science and Technology Division Poster Session
Presenter: J.-Y. Park, Seoul National University, Korea
Authors: J.-Y. Park, Seoul National University, Korea
S.-H. Kim, Seoul National University, Korea
Y.D. Suh, Seoul National University, Korea
W.-G. Park, Seoul National University, Korea
Y. Kuk, Seoul National University, Korea
Correspondent: Click to Email
Geometric and electronic properties of carbon nanotubes have been studied by ballistic electron projection microscopy(BEPM). An interference pattern between the scattered and transmitted e-beam was observed using coherent electron source from an atomically sharp emitter.@footnote 1@ In this work, a microcolumn in an SAFE(STM Aligned Field Emission) microcolumn system was replaced by carbon nanotubes or self-sustaining single crystal films on TEM grid.@footnote 2@ From images of single-walled carbon nanotubes, the performances of BEPM were tested. By adding an electrostatic energy analyzer, the electron energy loss of the nanotubes was measured. When the tip is positioned at < 2 nm, the tunneling I-V could be measured using BEPM. In addition to the nanotube, the results of free-standing single crystal metal and semiconductor will be presented. It was found that the Fourier transformation of inelastic scattering pattern gives information on scattering in the sample. @FootnoteText@ @footnote 1@H. -W. Fink, W. Stocker, H. Schmid, Phys. Rev. Lett. 65, 1204(1990). @footnote 2@J. -Y. Park et al., J. Vac. Sci. Technol. A 15, 1499(1997).