| AVS 45th International Symposium | |
| Electronic Materials and Processing Division | Wednesday Sessions |
| Session EM2-WeA |
| Session: | Application of Scanning Probes to Electronic Materials |
| Presenter: | J.S. Ha, ETRI, Republic of Korea |
| Authors: | J.S. Ha, ETRI, Republic of Korea K.-H. Park, ETRI, Republic of Korea W.S. Yun, ETRI, Republic of Korea E.-H. Lee, ETRI, Republic of Korea |
| Correspondent: | Click to Email |