AVS 64th International Symposium & Exhibition
    Novel Trends in Synchrotron and FEL-Based Analysis Focus Topic Thursday Sessions

Session SA+AC+MI-ThM
Frontiers in Probing Properties and Dynamics of Nanostructures and Correlation Spectroscopy

Thursday, November 2, 2017, 8:00 am, Room 9
Moderators: Jan Vogel, Institut Néel, CNRS/UGA, Grenoble, France, Christian Gutt, University of Siegen, Germany


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:00am SA+AC+MI-ThM1 Invited Paper
X-rays Revealing Exotic Properties of Magnetoelectric Multiferroics and Related Materials
Elke Arenholz, Lawrence Berkeley National Laboratory
8:40am SA+AC+MI-ThM3 Invited Paper
X-ray Reflectivity Investigations of Ultrafast Dynamics in Magnetic Multilayer Structures
Christian Gutt, T. Sant, D. Ksenzov, U. Pietsch, University of Siegen, Germany, J. Luening, Sorbonne University, F. Capotondi, E Pedersoli, M. Manfredda, M. Kiskinova, Elettra-Sincrotrone Trieste, Italy, M. Klaeui, H. Zabel, University of Mainz
9:20am SA+AC+MI-ThM5
Spray Deposition of Water-processed Active Layers of Hybrid Solar Cells Investigated with In situ X-ray Scattering Methods
Volker Körstgens, F. Buschek, M. Wörle, Technische Universität München, Germany, W. Ohm, DESY, Germany, H. Iglev, Technische Universität München, Germany, S.V. Roth, DESY, Germany, R. Kienberger, P. Müller-Buschbaum, Technische Universität München, Germany
9:40am SA+AC+MI-ThM6
New Instrumentation for Spin-integrated and Spin-resolved Momentum Microscopy – METIS and KREIOS
Thomas Schulmeyer, M. Wietstruk, A. Thissen, SPECS Surface Nano Analysis GmbH, Germany, G. Schoenhense, Johannes Gutenberg-Universität, Germany, A. Oelsner, Surface Concept GmbH, Germany, C. Tusche, Max Planck Institute for Microstructure Physics, Germany
11:00am SA+AC+MI-ThM10 Invited Paper
X-ray Photon Correlation Spectroscopy Studies of Soft Matter and Biomaterials
Laurence B. Lurio, Northern Illinois University
11:40am SA+AC+MI-ThM12 Invited Paper
Forefront Applications of XPCS
Anders Madsen, European XFEL GmbH, Germany