AVS 64th International Symposium & Exhibition | |
Novel Trends in Synchrotron and FEL-Based Analysis Focus Topic | Thursday Sessions |
Session SA+AC+MI-ThM |
Session: | Frontiers in Probing Properties and Dynamics of Nanostructures and Correlation Spectroscopy |
Presenter: | Thomas Schulmeyer, SPECS Surface Nano Analysis GmbH, Germany |
Authors: | T. Schulmeyer, SPECS Surface Nano Analysis GmbH, Germany M. Wietstruk, SPECS Surface Nano Analysis GmbH, Germany A. Thissen, SPECS Surface Nano Analysis GmbH, Germany G. Schoenhense, Johannes Gutenberg-Universität, Germany A. Oelsner, Surface Concept GmbH, Germany C. Tusche, Max Planck Institute for Microstructure Physics, Germany |
Correspondent: | Click to Email |
Two new momentum microscopes are presented by SPECS: our newly developed time-of-flight momentum microscope METIS and the energy dispersive and filtered momentum microscope KREIOS. Both are using an optimized lens design which provides simultaneously highest energy, angular and lateral resolution. The lens provides a full 2π solid acceptance angle with highest angular resolution. in contrast to standard ARPES measurements with conventional hemispherical analyzers, electronic structure data from and beyond the 1st Brillouin zone is recorded without any sample movement. In addition the lens of such an instrument can work in a lateral imaging mode for microscopy as well. This enables navigation on the sample and reduces the size of the area under investigation in ARPES down to a few micrometers in diameter. This combination of large acceptance angle, high angular resolution and small acceptance area, makes this instrument the ideal tool for electronic structure studies on small samples or sample areas. the design is compact with a straight optical axis. Operation modes are (kx,ky,Ek) data acquisition by operation in energy filtered k-space imaging, (ToF-)PEEM mode, energy-filtered real space imaging and micro-spectroscopy mode.
The 3D (kx, ky, Ek) data recording is done with a 2-dimensional delayline detector, with a time resolution of 150 ps and count rates up to 8 Mcps. It uses channelplates with 40 μm spatial resolution. While the x,y position of an incoming electron is converted into kx,ky wave vector, the kinetic energy Ek is determined from the flight time t in METIS or obtained directly by the energy filter in KREIOS. Spin-resolved imaging is achieved by electron reflection at a W(100) spin-filter crystal prior to the 2-dimensional delayline detector. Electrons are reflected in the [010] azimuth at 45° reflection angle. Varying the scattering energy one can choose positive, negative, or vanishing reflection asymmetry.
Besides a description on how the instruments work data from both instruments on different single crystalline materials will be presented.