AVS 64th International Symposium & Exhibition
    Novel Trends in Synchrotron and FEL-Based Analysis Focus Topic Thursday Sessions
       Session SA+AC+MI-ThM

Invited Paper SA+AC+MI-ThM12
Forefront Applications of XPCS

Thursday, November 2, 2017, 11:40 am, Room 9

Session: Frontiers in Probing Properties and Dynamics of Nanostructures and Correlation Spectroscopy
Presenter: Anders Madsen, European XFEL GmbH, Germany
Correspondent: Click to Email

Recent advances in dynamics studies of condensed matter by X-ray photon correlation methods will be discussed. Classical X-ray Photon Correlation Spectroscopy (XPCS) requires a (partially) coherent beam and a reliable detector and has benefitted a lot from recent synchrotron source upgrades and the advent of novel 2D pixel detectors. Weakly scattering systems and fast dynamics can now be characterized much better than only a few years back. The next generation of X-ray sources - X-ray Free-Electron Lasers (XFEL) - will deliver many orders of magnitude more coherent intensity than the present generation of synchrotrons but at the same time the pulsed nature of XFELs requires new XPCS-like techniques to be developed. In the presentation I discuss a few new methods that take advantage of the XFEL pulse pattern and allow dealing with the pertinent problem of beam induced damage to the samples. Examples of Scientific applications in soft- and hard-condensed matter will be given as well as an outlook to the forthcoming European XFEL facility where time-resolved coherent X-ray experiments will be carried out at the MID station.