AVS 64th International Symposium & Exhibition, Session NS+AS+EM+MI+SP+SS-ThM

AVS 64th International Symposium & Exhibition
Nanometer-scale Science and Technology Division	Thursday Sessions

Session NS+AS+EM+MI+SP+SS-ThM
Nanoscale Imaging and Characterization

Thursday, November 2, 2017, 8:00 am, Room 19
Moderators: Stephane Evoy, University of Alberta, Canada, Indira Seshadri, IBM Research Division, Albany, NY

Click here to Download program book for this session
in Adobe Acrobat format

Click a paper to see the details. Presenters are shown in bold type.

8:00am	NS+AS+EM+MI+SP+SS-ThM1 Characterizing Optoelectronically-Active Molecules via STM Imaging and Advanced Raman Spectroscopy Techniques J. Schultz, P. Whiteman, Z. Porach, Nan Jiang, University of Illinois at Chicago
8:20am	NS+AS+EM+MI+SP+SS-ThM2 BCC to FCC Phase Transition of Pd_xCu_1-x at Nanoscale Xiaoxiao Yu, Carnegie Mellon University, A. Gellman, Carnegie Mellon University, W.E. Scott Institute for Energy Innovation
8:40am	NS+AS+EM+MI+SP+SS-ThM3 Invited Paper Hybrid Environmental Transmission Electron Microscope: An Integrated Platform for In situ Imaging and Spectroscopies Renu Sharma, NIST
9:20am	NS+AS+EM+MI+SP+SS-ThM5 Critical Dimension Metrology by Localization Optical Microscopy C.R. Copeland, C.D. McGray, J.C. Geist, J.A. Liddle, B.R. Ilic, Samuel Stavis, NIST
9:40am	NS+AS+EM+MI+SP+SS-ThM6 Tunable Emission from Nanophotonic Structures in a Modified SEM: Characterizing Smith Purcell Radiation Generation from the VUV to the Near IR Steven Kooi, I. Kaminer, A. Massuda, M. Soljačić, C. Roques-Carmes, MIT
11:00am	NS+AS+EM+MI+SP+SS-ThM10 Invited Paper Ultrafast Optical Response of Graphene/LaAlO3/SrTiO3 Heterostructure L. Chen, E. Sutton, J. Li, M. Huang, J.F. Hsu, B. D'Urso, University of Pittsburgh, J.W. Lee, H. Lee, C.B. Eom, University of Wisconsin-Madison, P. Irvin, Jeremy Levy, University of Pittsburgh
11:40am	NS+AS+EM+MI+SP+SS-ThM12 Single-Molecules Fluorescence Spectroscopy and Lifetime with Simultaneous Super-resolution Imaging for Materials Science Applications James Marr, CNST/NIST and University of Maryland, M. Davanço, CNST/NIST, S.J. Stranick, NIST, B.R. Ilic, J.A. Liddle, CNST/NIST
12:00pm	NS+AS+EM+MI+SP+SS-ThM13 Atomic Scale Surface Effects of Controlled Crystal Structure in III-V Semiconductor Nanowires: Preferential Surface Alloying and Local Electronic Properties. J. Knutsson, M. Hjort, Lund University, Sweden, P. Kratzer, University Duisburg-Essen, Germany, J. Webb, S. Lehmann, K.D. Thelander, Lund University, Sweden, C.J. Palmstrom, UCSB, R. Timm, Anders Mikkelsen, Lund University, Sweden