| AVS 64th International Symposium & Exhibition | |
| Nanometer-scale Science and Technology Division | Thursday Sessions |
| Session NS+AS+EM+MI+SP+SS-ThM |
| Session: | Nanoscale Imaging and Characterization |
| Presenter: | Steven Kooi, MIT |
| Authors: | S.E. Kooi, MIT I. Kaminer, MIT A. Massuda, MIT M. Soljačić, MIT C. Roques-Carmes, MIT |
| Correspondent: | Click to Email |
We present theoretical predictions and experimental results of multiple order Smith-Purcell radiation in a variety of samples from periodic high aspect ratio silicon nanowire structures to engineered metasurfaces using low-energy electrons (2.5 -20 keV) in a modified scanning electron microscope. The samples emit photons in a controlled way and we demonstrate optical emission from the VUV to the near IR, opening a pathway to building a fully tunable optical source that we intend to extend into the soft X-Ray regime.